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Sep 8

SymRTLO: Enhancing RTL Code Optimization with LLMs and Neuron-Inspired Symbolic Reasoning

Optimizing Register Transfer Level (RTL) code is crucial for improving the power, performance, and area (PPA) of digital circuits in the early stages of synthesis. Manual rewriting, guided by synthesis feedback, can yield high-quality results but is time-consuming and error-prone. Most existing compiler-based approaches have difficulty handling complex design constraints. Large Language Model (LLM)-based methods have emerged as a promising alternative to address these challenges. However, LLM-based approaches often face difficulties in ensuring alignment between the generated code and the provided prompts. This paper presents SymRTLO, a novel neuron-symbolic RTL optimization framework that seamlessly integrates LLM-based code rewriting with symbolic reasoning techniques. Our method incorporates a retrieval-augmented generation (RAG) system of optimization rules and Abstract Syntax Tree (AST)-based templates, enabling LLM-based rewriting that maintains syntactic correctness while minimizing undesired circuit behaviors. A symbolic module is proposed for analyzing and optimizing finite state machine (FSM) logic, allowing fine-grained state merging and partial specification handling beyond the scope of pattern-based compilers. Furthermore, a fast verification pipeline, combining formal equivalence checks with test-driven validation, further reduces the complexity of verification. Experiments on the RTL-Rewriter benchmark with Synopsys Design Compiler and Yosys show that SymRTLO improves power, performance, and area (PPA) by up to 43.9%, 62.5%, and 51.1%, respectively, compared to the state-of-the-art methods.

Use Property-Based Testing to Bridge LLM Code Generation and Validation

Large Language Models (LLMs) excel at code generation, but ensuring their outputs to be functionally correct, especially in complex programming tasks, is a persistent challenge. While traditional Test-Driven Development (TDD) offers a path for code refinement, its efficacy with LLMs is often undermined by the scarcity of high-quality test cases or the pitfalls of automated test generation, including biased tests or inaccurate output predictions that can misdirect the correction process. This paper introduces Property-Generated Solver, a novel framework that leverages Property-Based Testing (PBT) to validate high-level program properties or invariants, instead of relying on specific input-output examples. These properties are often simpler to define and verify than directly predicting exhaustive test oracles, breaking the "cycle of self-deception" where tests might share flaws with the code they are meant to validate. Property-Generated Solver employs two collaborative LLM-based agents: a Generator dedicated to code generation and iterative refinement, and a Tester that manages the PBT life-cycle and formulate semantically rich feedback from property violations. The resulting comprehensive and actionable feedback then guides the Generator in its refinement efforts. By establishing PBT as the core validation engine within this iterative, closed-loop paradigm, Property-Generated Solver provides a robust mechanism for steering LLMs towards more correct and generalizable code. Extensive experimental results on multiple code generation benchmarks demonstrate that Property-Generated Solver achieves substantial pass@1 improvements, ranging from 23.1% to 37.3% relative gains over established TDD methods.

Degradation Prediction of Semiconductor Lasers using Conditional Variational Autoencoder

Semiconductor lasers have been rapidly evolving to meet the demands of next-generation optical networks. This imposes much more stringent requirements on the laser reliability, which are dominated by degradation mechanisms (e.g., sudden degradation) limiting the semiconductor laser lifetime. Physics-based approaches are often used to characterize the degradation behavior analytically, yet explicit domain knowledge and accurate mathematical models are required. Building such models can be very challenging due to a lack of a full understanding of the complex physical processes inducing the degradation under various operating conditions. To overcome the aforementioned limitations, we propose a new data-driven approach, extracting useful insights from the operational monitored data to predict the degradation trend without requiring any specific knowledge or using any physical model. The proposed approach is based on an unsupervised technique, a conditional variational autoencoder, and validated using vertical-cavity surface-emitting laser (VCSEL) and tunable edge emitting laser reliability data. The experimental results confirm that our model (i) achieves a good degradation prediction and generalization performance by yielding an F1 score of 95.3%, (ii) outperforms several baseline ML based anomaly detection techniques, and (iii) helps to shorten the aging tests by early predicting the failed devices before the end of the test and thereby saving costs